Los Angeles, CA -- (SBWIRE) -- 05/03/2019 -- Atomic-force microscopy (AFM) or scanning-force Microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

AFM provides a 3D profile of the surface on a nanoscale, by measuring forces between a sharp probe (<10 nm) and surface at very short distance (0.2-10 nm probe-sample separation). The probe is supported on a flexible cantilever. The AFM tip "gently" touches the surface and records the small force between the probe and the surface.

Atomic force microscopy is arguably the most versatile and powerful microscopy technology for studying samples at nanoscale. It is versatile because an atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements to the needs of scientists and engineers. It is powerful because an AFM can generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation.

The main markets for AFM are academia, research labs and the semiconductors and electronics sector, with growing markets in biology and the life sciences and nanotechnology and nanomaterials research. In semiconductors, the measurement and manipulation of nanomaterials becomes increasingly challenging as the continuous shrinking of dimensions requires higher lateral resolution. The AFM has become a standard and widely spread instrument for characterizing such nanoscale devices and can be found in most of today's research and development areas.

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Increasing government and corporate funding in life sciences and nanotechnology is predominantly driving the microscopy market. Furthermore, technological advances that enhance ease of usage, automation, better quality imaging, faster and better analysis have also had a huge positive impact on the market.

However, the characterization of three dimensional high-aspect ratio and sidewall structures can prove problematic. And there are other microscopes can be used to replace AFM, like SNOM (Near-field scanning optical microscopy).

In 2018, the global Atomic Force Microscope market size was 320 million US$ and it is expected to reach 400 million US$ by the end of 2025, with a CAGR of 2.8% between 2019 and 2025.

This report studies the Atomic Force Microscope market size by players, regions, product types and end industries, history data 2014-2018 and forecast data 2019-2025; This report also studies the global market competition landscape, market drivers and trends, opportunities and challenges, risks and entry barriers, sales channels, distributors and Porter's Five Forces Analysis.

This report focuses on the global top players, covered

Bruker Corporation

JPK Instruments

NT-MDT

Keysight Technologies

Park Systems

Witec

Asylum Research (Oxford Instruments)

Nanonics Imaging

Nanosurf

Hitachi High-Technologies

Anasys Instruments

RHK Technology

A.P.E. Research

Market segment by Regions/Countries, this report covers

North America

Europe

China

Rest of Asia Pacific

Central & South America

Middle East & Africa

Market segment by Type, the product can be split into

Research Grade AFM

Industrial Grade AFM

Market segment by Application, the market can be split into

Life Sciences and Biology

Semiconductors and Electronics

Nanomaterials Science

Other

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