Albany, NY -- (SBWIRE) -- 04/09/2014 -- Failure analysis is an engineering approach to determining how and why component or equipment has failed. The goal of a failure analysis is to understand the root cause of the failure to prevent similar failures in the future. Common causes of failure include misuse or abuse, manufacturing defects, assembly errors, improper maintenance, design errors, improper material, fastener failure, improper heat treatments, inadequate quality assurance, inadequate environmental protection/control, unforeseen operating conditions and casting discontinuities.

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This market research study analyzes the failure analysis equipment market on a global level, and provides estimates in terms of revenue (USD Billion) from 2013 to 2019. It recognizes the drivers and restraints affecting the industry and analyzes their impact over the forecasted period. Moreover, it identifies the significant opportunities for market growth in the years to come.

The report segments the market on the basis of geography into North America, Asia Pacific (APAC), Europe, and Rest of the World (RoW), and estimated in terms of revenue (USD Billion). In addition, the report segments the market based on equipments which includes Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Focused Ion Beam Systems (FIB) and Dual Beam (FIB/SEM) Systems.

Furthermore, the report has also been segmented on the basis of end-use which includes Semiconductors Manufacturing, Fiber Optics, Bio medical and life sciences, Metallurgy, Nanotechnology and nanomaterials and Polymers. Moreover, the report segments the market based on technology which includes Focused Ion Beam (FIB), Broad Ion Milling (BIM), Secondary ion mass spectroscopy (SIMS), Energy dispersive X-ray spectroscopy (EDX), Reactive ion etching (RIE) and Chemical mechanical planarization (CMP). All these segments have also been estimated on the basis of geography in terms of revenue (USD Billion).

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The report provides company market share analysis of the various industry participants. Key players have also been profiled on the basis of company overview, financial overview, business strategies, SWOT analysis, and recent developments in the field of failure analysis equipment. Major market participants profiled in this report include FEI Company, Hitachi High-Technologies Europe GmbH, Carl Zeiss SMT GmbH and JEOL, Ltd. among others.

Failure analysis equipment Market: By geography

North America
Europe
Asia Pacific
Rest of the World

Failure analysis equipment Market: By equipment

Scanning electron microscope (SEM)
Transmission electron microscope (TEM)
Focused Ion Beam system (FIB)
Dual - Beam (FIB/SEM) systems

Failure analysis equipment Market: By technology

Focused ion beam (FIB)
Broad ion milling (BIM)
Secondary ion mass spectroscopy (SIMS)
Energy dispersive X-ray spectroscopy (EDX)
Reactive ion etching (RIE)
Chemical mechanical planarization (CMP)

Failure analysis equipment Market: By end-use

Semiconductors manufacturing
Fiber optics
Bio-medical and life sciences
Metallurgy
Nanotechnology and nanomaterials

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Polymers

The report provides a cross-sectional analysis of all the above segments with respect to the following regions:

North America
Europe
Asia Pacific
Rest of the World (RoW)

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