E-Beam Wafer Inspection System Market - the Biggest Trends to Watch out for 2017-2025
Wafer inspection systems are required for timely detection of physical and technological defects present within wafers. Currently, both e-beam and optical technologies are used in the detection of defects in wafers. With the application of e-beams manufacturers of compact devices are able to timely detect faults in wafers, thus saving the additional expenditure, which otherwise they would incur on re-inspection. The technology therefore ensures long-term usage of wafers across various industrial verticals. This has emerged as a key reason, positively...
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