Scanning-Force Microscopes (SFM) Market Analysis, Trends and Forecast to 2025: Bruker Corporation, JPK Instruments, NT-MDT, Keysight Technologies
Atomic-force microscopy (AFM) or scanning-force Microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. AFM provides a 3D profile of the surface on a nanoscale, by measuring forces between a sharp probe (<10 nm) and surface at very short distance (0.2-10 nm probe-sample separation). The probe is supported on a flexible cantilever. The AFM tip "gently" touches...
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