Atomic Force Microscopes Market : Industry Analysis and Detailed Profiles of Top Industry Players
Atomic force microscopes refer to the scanning probe microscopes that are designed to measure several properties such as height, magnetism and friction with the help of a probe. This type of microscope measures the local property simultaneously by scanning the probe over a small area of the sample. Atomic force microscopy (AFM) shares its key components with the scanning microscopy except for the probe tip. Typically atomic force microscopes operate in three basic modes namely contact, noncontact and tapping mode....
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