Scanning Probe Microscopy Market Will to Grow at a CAGR of 9.76% Worldwide over the Period 2014-2019: ResearchMoz
Scanning probe microscope (SPM) is an advanced microscope that uses a physical probe to scan the specimen. These microscopes provide high magnification and are specifically used for observation of three-dimensional specimens. In 1981, it was introduced as a pioneer in providing high atomic resolution. Initially, SPMs were mainly used for measuring 3D surface topography. Although they are now being used for measuring many other surface properties, they are still used primarily for 3D topography. SPMs were the first to produce...
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